应用：
•检测和红外辐射的可视化从CW激光，脉冲激光和红外激光二极管
•模式结构的鉴定
特征：
•高灵敏度
•高损伤阈值
•广泛覆盖的光谱范围
•没有激活所需
•无漂白
IR-VIS从ALPHALAS系列独有的红外线到可见光适合CW和脉冲红外激光源转换器以及红外激光二极管。它们适合于如检测无形的红外线辐射，识别模式结构等，因此任务，该展示台是使用钕每一个实验室不可或缺的工具：YAG或其他红外激光器。
根据一个特殊的耐用类陶瓷材料，该检测器结合了高损伤阈值较高的灵敏度。与其它常规的红外至可见光转换器，从ALPHALAS对IR-VIS系列不需要用日光或UV光的任何活化，因此可以在黑暗的房间中使用。另外，被照射的区域不漂白。如果活性区域的表面已被破坏，上层可简单地用细文件或砂纸除去。新的新鲜表面是和原来的一样好。
标准-S和-D模型包括两红外光谱范围从800纳米至1100纳米和1460纳米至1600纳米，导致绿色和橙色发射相应。有源区的直径为15mm或40毫米。该车型-S有单面和-D模式是双面的。
特别-QM模型是用于仅Q开关和锁模激光器。它是基于一种高效二次谐波生成处理，并覆盖宽光谱范围从800纳米至1400纳米。它也是双面的，其直径为30毫米。
The IR-VIS series from ALPHALAS are unique infrared-to-visible converters suitable for CW and pulsed IR laser sources as well as IR laser diodes. They are ideally suited for tasks like detecting invisible IR radiation, identifying mode structure, etc. Therefore, the visualizers are indispensable tools for every laboratory using Nd:YAG or other IR lasers.
Based on a special durable ceramic-like material, the detectors combine high sensitivity with high damage threshold. In contrast to other conventional infrared-to-visible converters, the IR-VIS series from ALPHALAS do not need any activation with daylight or UV light and can therefore be used in darkened rooms. In addition, the irradiated area does not bleach. If the surface of the active area has been damaged, the upper layer can be simply removed using a fine file or sand paper. The new fresh surface is as good as the original one.
The standard -S and -D models cover two IR spectral ranges from 800 nm to 1100 nm and from 1460 nm to 1600 nm, resulting in green and orange emission correspondingly. The diameter of the active area is 15 mm or 40 mm. The -S models are single-sided and the -D model is double-sided.
The special -QM model is for Q-switched and modelocked lasers only. It is based on an efficient second-harmonic generation process and covers the wide spectral range from 800 nm to 1400 nm. It is also double-sided and has a diameter of 30 mm.
Features
High Sensitivity
High Damage Threshold
Cover Wide Spectral Ranges
No Activation Needed
No Bleaching
Applications
Detection & Visualization of IR Radiationfrom CW Lasers, Pulsed Lasers, and IR Laser Diodes
Identification of Mode Structure
